Signal Integrity Journal (SIJ), a sister publication to Microwave Journal, covers signal integrity, power integrity and EMC/EMI related topics with industry news, technical articles, white papers, products, Buyer’s Guide, webinars, videos and more. SI Journal is the only peer reviewed, industry journal covering these markets. It began as a website, www.signalintegrityjournal.com, and added the publication of a magazine in 2017. A distinguished Editorial Advisory Board (EAB), https://www.signalintegrityjournal.com/articles/651-sij-editorial-advisory-board assists the editorial staff in the article review process and generation of quality content. Editor: Janine Love, Editor and EDI CON Technical Program Director Technical Editor: Eric Bogatin, Professor, University of Colorado, Boulder in the ECEE dept and Teledyne LeCroy Fellow Contributing Editor: Patrick Hindle, Editorial Director at Microwave Journal Editorial Advisory Board (EAB): Rula Bakleh, Graphcore, Inc. Jay Diepenbrock, SI/RF Consultant Vladimir Dmitriev-Zdorov, Mentor Graphics Jason Ellison, Amphenol Barry Katz, MathWorks Cathy Liu, Broadcom Alfred Neves, Wildriver Technology Istvan Novak, Samtec Steve Sandler, Picotest Yuriy Shlepnev, Simberian Inc. Bert Simonovich, LAMSIM Enterprises Stephen Slater, Keysight Technologies Larry Smith, Micron Michael Violette, Washington Laboratories Learn more here: https://www.signalintegrityjournal.com/aboutus