Eurofins | MASER, founded in 1993, is an independent engineering service company operating in the semiconductor and electronic systems industry. Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier or in Aerospace and Space applications. Technology focus areas: * Advanced nodes 40/65/90nm and 28nm * Automotive * MEMS and Sensors * LED * High Temp / High Rel Failure Analysis: * FIB circuit edit * Failure Analysis * Construction Analysis * IPC-A-610/600 inspection Failure Analysis: * Solderball renewal * First Silicon Circuit Edit * Non destructive analysis * Optical, X-ray, SAM, SEM-EDX and LIT inspection * Sample preparation * Decapsulation using chemical, laser ablation and Microwave Induced Plasma (MIP) * Mechanical cross-sectioning * ASAP micropolish * Frontside delayering and backside deprocessing * Fault localisation and imaging * EMMI/OBIRCH analysis * Lock-In Thermography (LIT) analysis * Atomic Force Microscopy (AFM) * Failure analysis and imaging * FIB Cross-sectioning * SEM-EDX analysis and imaging after delayering/deprocessing * (S)TEM analysis and imaging Reliability Testing: * Product qualification programs according to AEC-Q100-JEDEC–MIL–ESDA–IEC Semiconductor * Electrical characterization * BI and Environmental (humidity/temperature) testing (MSL preconditioning, HAST, UHST, TC, PTC, THB, HTS, HTOL, LTOL, ELFR) * ESD (HBM / CDM / MM / Gate Leakage / ESD gun) and Latch-Up * Wire pull, ball, die and solderball shear * Mechanical testing (MV, MS, CA, PIND, fine and gross leak) Board Level * BLR Drop, BLR TC and BLR Bending System Level * HALT * Mechanical (vibration, bump and shock) * Environmental (humidity/temperature) testing * Corrosion (salt mist and mixed gas), IP (water and dust) and Solar radiation testing