We are a precision optical engineering company focused on highly accurate dimensional inspection solutions to improve real-time quality control and facilitate greater automation of the industrial manufacturing process. Our research team, patent position, and field product strategy, plus an experienced management team position us to lead the increasingly consequential field of precision metrology. ⭕Success Story: ContourPro 4D Intel approached us to develop a QC solution for pin tips of CPU sockets whose discrete shiny and dark surfaces are challenging to inspect. ContourPro 4D was developed in conjunction with Intel’s AMCL Lab and UNCC’s Center for Precision Metrology, establishing an ongoing partnership. Industry-leading advanced 3D profilometry systems with a unique combination of algorithms and structured light techniques provide the cleanest, fastest, least invasive, and most comprehensive 3D data for modeling and analysis across a range of component characteristics. • Faster Inspection Speed – 10 hours to a few minutes • More Accurate – 10 Microns ⭕Success Story: Film Layer Thickness (TFLT 100) Our 2nd family of products evolved from advanced requirements and continuing collaboration with Intel and UNCC and is ready for commercialization. • Capacity to measure films/layers with rough surfaces and/or scattering material (e.g., conformal coating, paper, solder resist, polluted conditions, pigmented) • Range of measurement: 20um to 2mm • The non-contact and non-destructive method effectively measures layers Key-Value Applications: Semiconductor, Automotive, Aerospace, Petrochemical, Pharmaceutical, Plastic Film & Glass ◼️ QC, solder resist, paint layers & paper thickness ◼️ Predictive Maintenance As electronic components get smaller and denser, qualifying defects and fine-scale features becomes more critical to competitive advantage and performance. Effective QC demands advanced precision metrology capabilities. ⭕Optoniks is READY. Contact: info(at)optio