Nanometrisis delivers software and consulting services for the characterization of nanostructure morphology and surface topography through the analysis of their microscope images. We are an innovative software company in the fast-growing field of nanotechnology covering the rapidly emergent need for accurate, reliable and targeted metrological characterization of nanotechnology products. Nanometrisis is a spin-off company of the Institute of Nanoscience and Nanotechnology of NCSR Demokritos. Our vision is to become an irreplaceable partner for industries needing accurate, reliable and targeted metrological characterization of nanotechnology products. We aspire to become your reliable nanometrology expert. This is accomplished by the continuous incorporation of state-of-the-art mathematical methodologies inspired by information science and complex theory in our software, reaching out towards hybrid and “smart” metrology.