FemtoMetrix® is the world leader in optical Non-Visual Defect (NVD) inspection for surface and buried defects, delivering new inspection capabilities with its patented Harmonic F1x® inspection system. The Harmonic F1x system is capable of detecting NVDs including defects located at buried interfaces. Applications exist for bulk silicon as well as SOI, GaN, SiC and other advanced engineering substrates. Whether you’re in a high-volume, advanced fab, in pilot production, development or a research lab, there’s a Harmonic F1x® tool that will enable you to improve yield, increase fab profitability and further your advanced research initiatives.