MikroMasch® offers AFM probes and test structures. AFM (Atomic Force Microscopy) is a widely-used instrument and technique for non-destructive surface investigations as well as for surface modifications at the nanoscale. Besides topography, AFM is capable of collecting information that relates to local material properties such as adhesion, stiffness, elasticity, conductivity, coercitivity, etc. The principle of AFM consists in registering the force experienced by the probe from the sample as the probe scans its surface. There are other scanning techniques like STM or NSOM, where the probe is designed to register other physical values. All these techniques and instruments are referred to as SPM (Scanning Probe Microscopy). So AFM is a part of SPM. Mikromasch is a trademark of Nanoworld AG operated by ISB Ltd. Impressum https://www.spmtips.com/imrpressum