NanoScope offers commercial SEM TEM and FIB lab services for the semiconductor, materials science and Nano-research industries. We specialise in quick turn-around and complex modifications to advanced semiconductor devices (copper), to prove design changes and correct functionality on 1st silicon devices. We also provide QA, failure and materials analysis including site specific TEM sample preparation, extraction and analysis for the highest resolution materials and metrology studies. Our complimentary services include Optical microscopy, CSAM and X-ray analysis of packages, decapsulation and MEMS device degling, FIB, SEM and TEM imaging and analysis, glob-topping and other techniques such as SIMS and EDS and also low cost Reliability testing services and some TEM section liftout solutions. Principle geographic areas served: Europe and Israel