Mu-TEST is a game changer in the Automated Test Equipment (ATE) industry. Thanks to its revolutionary, FPGA-based hardware, Mu-TEST dramatically reduces the Cost of Test (CoT) for all the IC Semiconductor Companies. Our Mission : To develop , market and support unprecedented solutions to help IC SOC suppliers to reduce their COST by 30 to 50%. Highlight: Direct Access to our ATE R&D engineering expert to support your project, providing turn key solution Why Mu-TEST ? Scalability, Fully evolutionary, Performances, no compromise, Time-to-Market, Easy to use and ... at lowest COO! Test under radiation: Test under radiation (ei: Spatial MIL-STD-883E/Method 1020.1) up to 6 meters distance between test equipment and Device under test!