MaxMile currently emphasizes on the technology innovation in the area of nondestructive testing or evaluation (NDT or NDE) for semiconductor industry. It offers various unique and simple solutions to the semiconductor research & development industry with new capabilities and better efficiencies. MaxMile EpiEL mapping system is a LED epiwafer electroluminescence (EL) mapping system. It is a virtual LED device fabrication & characterization system which can be used to measure LED device parameters directly on epiwafers. EL measurement is usually performed on finished device (such as LED) since it needs a device structure to inject current. MaxMile EpiEL technology overcomes this limitation by instantly forming a well-defined LED device inside the material. Without any costly and time-consuming device fabrication, EpiEL reveals not only the electro-luminescence (EL) but also various electrical properties of the material. MaxMile EL/PL (Photoluminescence) combination mapping system combines both proprietary EpiEL and PL technologies into one system, which can work either (a) as a regular EpiEL mapping system, or (b) as a regular PL mapper, or (C) as an EL/PL combination mapper. In one test run, MaxMile EL/PL combination mapping system provides not only EL of regular EpiEL mapper and PL of regular PL mapper, but also EL and PL of same sampling location which provides an extra dimension of information to investigate the information of the material. With such unique capabilities, MaxMile EpiEL and EL/PL combination technologies provide an unprecedented EL and PL solution for optoelectronic industry which brings new capability and better efficiencies: • Enabling device-level quality control at early stage. • Providing instant response for LED material development. • Enabling "fabless" LED material and CVD system development. • Facilitating LED/LD research and development (R&D) with a powerful tool.