Fractilia, LLC is the leader in stochastics metrology and control solutions for advanced semiconductor manufacturing. Its patented Fractilia Inverse Linescan Model (FILM™) technology provides customers with highly accurate and precise measurements of stochastics, which are the single largest source of patterning errors at advanced nodes. As a result, fabs can improve device yield and performance, as well as patterning productivity. Fractilia combines expertise in stochastics, lithography and software to develop proprietary, physics-based algorithms, which are optimizing processes throughout the industry, including with four of the top five chip manufacturers. Fractilia is headquartered in Austin, Texas.