We are building ultrafast spectrometers for microscopy and microscopy tools for defect inspection in semiconductors. We primarily manufacture products for researchers in academic and national labs, but we are developing more large-scale solutions for user facilities seeking to combine ultrafast resolution with imaging. Our flagship system is capable of a variety of techniques: transient absorption spectroscopy, multidimensional coherent spectroscopy, and stimulated Raman. These nonlinear methods are very sensitive to defects in semiconductors and large molecules, and we are now able to interface nonlinear spectroscopy with rapid high-resolution image scanning.