LMA is a spin-out company from Lancaster University, offering commercial access to materials analysis services, in particular scanning probe microscopy and cross-sectional imaging and analysis. LMA was originally incorporated to commercialise beam-exit cross-sectional polishing, an ion-beam milling technique patented by Lancaster University. LMA's close links with Lancaster University’s Department of Physics allow the company to tap into the considerable knowledge and expertise of researchers actively engaged in the study of a wide range of materials using a variety of techniques. We work closely with academics and industry in the semiconductor and coatings industries to further develop these techniques.