TeraProbes, Inc. is founded on a disruptive new technology developed at the OSU as an alternative to conventional contact-based probes. Our patented test-bed (the probe station and the proprietary non-contact probes) enables automated, industrial-scale electronic testing, without making physical contact with the chip. As such, the fragility and wear & tear issues that plague conventional contact probes are eliminated (along with maintenance costs) and the capital equipment cost is reduced by at least a factor of 20. More importantly, TeraProbes' test-bed is fully-automated, enabling unattended inspection of every single chip on the wafer, virtually eliminating operational costs.