ION-TOF is a manufacturer of innovative instruments for surface analysis with product lines for time-of-flight secondary ion mass spectrometers (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). We are the leading European manufacturer of TOF-SIMS for surface analysis and well known as technology leaders with excellent customer support. Founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialize the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany. Since the company's founding, the development and spread of TOF-SIMS has been significant and it can now be found in all areas of research and development where the chemistry of surfaces is important. Further, ION-TOF USA is the exclusive US agent for NanoScan's range of Magnetic Force Micoscopes (MFM) and Scanning Probe Microscopy (SPM) products.