Production of test equipment for measurement of Static and Dynamic parameters of discrete and modules components. Functional tester complete our offer to meet all customer requirements. Our long experience as supplier of power semiconductor tester let us provide solution for: - Wafer Test - KGD Test - Substrate Test - Power module Test Our continuous investment in R&D resources allows us to meet new testing requirements: - PCI™ technology for testing new chips up to 6 kV AC and 10 kV DC. - LSI™ technology, Low Stray Inductance for tester head and fixture - < 20nH stray inductance up to 1.5 meter on LSI fixture for best application and test cell maintenance - < 50nH stray inductance on standard fixture with LSI test head - AC test of multilevel configuration in true application condition with up to 4 gate drivers tester - AC and DC test of any configuration up to 3 level and 4 legs automatically managed by the tester