Material Characterization and Failure Analysis. We are experts in sample preparation, FIB cross-sectioning, FIB Circuit Edit. We serve R&D departments of high-tech companies requiring Failure Analysis, Competitor Analysis, Patent Infringements, Quality Control, Contamination Analysis and Surface Analysis for the Semiconductor, Automotive and Nanotechnology industries. Providing Photon Emission and OBIRCH fault localization techniques for fabless design houses.